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Author:

Zhang, Lei (Zhang, Lei.) | Wang, Hongguang (Wang, Hongguang.) | Shen, Jialin (Shen, Jialin.) | Wei, Huan (Wei, Huan.) | Wang, Xinbo (Wang, Xinbo.) | Li, Yongdong (Li, Yongdong.) | Liu, Chunliang (Liu, Chunliang.)

Indexed by:

Scopus SCIE EI SCOPUS

Abstract:

IEEEPassive intermodulation (PIM) interference that occurs in communication systems could limit the communication capacity and increase the manufacturing and maintenance costs. In this letter, a composite exponential model is developed to characterize the weak nonlinearity of passive components that causes PIM generation accurately. This proposed model fully considers the correlation between the PIM products on each order and the relation of PIM products with variation of carrier powers. For verification, a microwave filter is given to demonstrate the effectiveness of this composite model, and the reliability of this model is proved by the sensitivity analysis due to measurement uncertainty. Besides, the good agreement between the calculated powers of PIM products and the measured data shows that it can provide a theoretical guidance for PIM performance assessment in engineering application, thereby evaluating the influence of PIM interference on communication quality effectively.

Keyword:

Composite exponential model microwave filter nonlinearity passive intermodulation (PIM) sensitivity analysis

Author Community:

  • [ 1 ] [Zhang, Lei; Wang, Hongguang; Li, Yongdong; Liu, Chunliang] Xi An Jiao Tong Univ, Dept Elect Sci & Technol, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China
  • [ 2 ] [Shen, Jialin] Xidian Univ, Sch Phys & Optoelect Engn, Xian 710071, Shaanxi, Peoples R China
  • [ 3 ] [Wei, Huan; Wang, Xinbo] Sci & Technol Space Microwave Lab, Xian 710100, Shaanxi, Peoples R China
  • [ 4 ] [Zhang, Lei]Xi An Jiao Tong Univ, Dept Elect Sci & Technol, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China
  • [ 5 ] [Wang, Hongguang]Xi An Jiao Tong Univ, Dept Elect Sci & Technol, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China
  • [ 6 ] [Li, Yongdong]Xi An Jiao Tong Univ, Dept Elect Sci & Technol, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China
  • [ 7 ] [Liu, Chunliang]Xi An Jiao Tong Univ, Dept Elect Sci & Technol, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China
  • [ 8 ] [Shen, Jialin]Xidian Univ, Sch Phys & Optoelect Engn, Xian 710071, Shaanxi, Peoples R China
  • [ 9 ] [Wei, Huan]Sci & Technol Space Microwave Lab, Xian 710100, Shaanxi, Peoples R China
  • [ 10 ] [Wang, Xinbo]Sci & Technol Space Microwave Lab, Xian 710100, Shaanxi, Peoples R China

Reprint Author's Address:

  • Xi An Jiao Tong Univ, Dept Elect Sci & Technol, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Shaanxi, Peoples R China.

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Source :

IEEE Transactions on Electromagnetic Compatibility

ISSN: 0018-9375

Year: 2019

Issue: 2

Volume: 61

Page: 590-594

1 . 8 8 2

JCR@2019

2 . 0 0 6

JCR@2020

ESI Discipline: ENGINEERING;

ESI HC Threshold:83

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 14

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