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Author:

Zheng, TL (Zheng, TL.) | Luo, JS (Luo, JS.) | Zhang, X (Zhang, X.)

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CPCI-S EI Scopus

Abstract:

The electrothermal simulation of high-voltage MOSFET in thin SOI for self-heating effects is performed by means of MIDICI, a commercial 2-D numerical simulator. By varying thermal conductivity of the buried oxide, we can extract the self-heating effects merely from the great rise in thermal resistance of the substrate, which are defined as the pure self-heating effect. The pure self-heating in SOI MOSFET is also presented for universality of the concept.

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Author Community:

  • [ 1 ] Xian Jiaotong Univ, Inst Microelect, Xian 710049, Peoples R China

Reprint Author's Address:

  • Xian Jiaotong Univ, Inst Microelect, Xian 710049, Peoples R China.

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Source :

SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1 AND 2, PROCEEDINGS

Year: 2001

Page: 665-668

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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